BYD

Last updated February 1, 2026

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Interconnected solar cell array architecture: BYDRecent Research Landscape

Charge carrier recombination at metal-silicon interfaces reduces conversion efficiency and thermal stability. Precise control of the passivation layer architecture minimizes these losses to maximize cell voltage and output.

What technical problems is BYD addressing in Interconnected solar cell array architecture?

Interconnect mechanical failure

(52)evidences

Unprotected silicon surfaces lead to significant charge carrier annihilation. Reducing these losses increases open-circuit voltage and overall conversion efficiency.

Perovskite film morphological instability

(24)evidences

Uncontrolled crystal growth and structural defects during film formation lead to poor electronic quality. Resolving this instability ensures uniform charge transport and prevents premature device failure.