Interconnective power busbar architecture: BYDRecent Research Landscape
High electrical resistance at module junctions causes thermal runaway and energy loss. These innovations utilize specialized power connection components to stabilize current flow across storage systems.
What technical problems is BYD addressing in Interconnective power busbar architecture?
Interconnective electrical contact resistance
(73)evidences
High resistance at connection points causes localized heating and power loss in high-current energy storage systems. Minimizing this resistance prevents thermal runaway and improves overall system efficiency.
Uneven thermal distribution
(67)evidences
Inconsistent heat dissipation across high-density battery modules leads to localized hotspots and accelerated cell degradation. Uniform thermal management prevents premature system failure and thermal runaway.