Charge carrier recombination at the contact interfaces limits open-circuit voltage and overall conversion efficiency. Reducing these losses through passivation structures increases the theoretical efficiency limit of the device.

Inconsistent crystallization during film formation leads to poor morphology and low device reproducibility. Controlling these kinetics ensures uniform film quality and higher power conversion efficiency.

Moisture and oxygen ingress cause rapid degradation of active layers in photovoltaic assemblies. Improving the barrier integrity prevents premature device failure and extends operational lifespan.