Semiconductor refrigeration plate adhesive formulation: BYDRecent Research Landscape
Thermal interface failure in cooling modules leads to rapid component degradation and energy loss. These innovations stabilize the bond between refrigeration sheets to ensure consistent heat transfer and structural integrity.
What technical problems is BYD addressing in Semiconductor refrigeration plate adhesive formulation?
Excessive thermal stress failure
(57)evidences
Mismatched thermal expansion between power modules and cooling plates causes mechanical fatigue and bond failure. Mitigating this degradation ensures long-term structural integrity and heat dissipation efficiency in high-power vehicle electronics.
Excessive thermal interface resistance
(34)evidences
Excessive heat accumulation in power modules leads to component failure and system instability. Mitigating this thermal stress prevents permanent device degradation and ensures operational safety in high-power vehicle electronics.
Thermal interface failure
(10)evidences
Differential expansion rates between rigid semiconductor cooling plates and electronic substrates cause mechanical stress and delamination. Mitigating this failure mode ensures structural integrity and consistent heat transfer in high-power modules.