Mars

Last updated January 31, 2026

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Semiconductor surface texture modulation: MarsRecent Research Landscape

Standard silicon probes suffer from low signal quality and geometric degradation during high-energy particle irradiation. Engineering the porosity and aspect ratio of the semiconductor substrate improves detection sensitivity and structural longevity in scanning microscopy.

What technical problems is Mars addressing in Semiconductor surface texture modulation?

Inadequate light trapping efficiency

(2)evidences

Poor structural quality and low aspect ratios in silicon probes lead to measurement inaccuracies and rapid wear. Achieving geometric precision ensures high-resolution imaging and prolonged probe durability.

Inaccurate ionizing radiation quantification

(1)evidences

Insufficient interaction volume between incident particles and the semiconductor substrate. Increasing the effective surface area through porosity overcomes the limited capture cross-section of planar structures.